G. S. Zahn, F. A. Genezini, M. Moralles, P. T. D. Siqueira, N. H. Medina, V. A. P. Aguiar, E. L. A. Macchione, N. Added, M. A. G. da Silveira

JOURNAL OF PHYSICS. CONFERENCE SERIES

13/08/2019

Abstract

Abstract In this work, we present a facility to study errors in digital devices exposed to thermal neutrons from a beam hole in the IEA-R1 nuclear reactor, as well as the long-lived isotopes produced in the irradiation of digital electronic devices under a slow neutron field. Preliminary results obtained with the analysis of a 28nm SRAM-based Xilinx Zynq-7000 FPGA are presented.

10.1088/1742-6596/1291/1/012020