1 de outubro de 2020 | Publicações

Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications

T.F. Silva, C.L. Rodrigues, N. Added, M.A. Rizzutto, M.H. Tabacniks, A. Mangiarotti, J.F. Curado, F.R. Aguirre, N.F. Aguero, P.R.P. Allegro, P.H.O.V. Campos, J.M. Restrepo, G.F. Trindade, M.R. Antonio, R.F. Assis, A.R. Leite

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

01/05/2018

Abstract

10.1016/j.nimb.2018.03.006