1 de outubro de 2020 | Publicações

Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA

Luis A. C. Benites, Fabio Benevenuti, Adria B. De Oliveira, Fernanda L. Kastensmidt, Nemitala Added, Vitor A. P. Aguiar, Nilberto H. Medina, Marcilei A. Guazzelli

IEEE Transactions on Nuclear Science

01/07/2019

Abstract

10.1109/tns.2019.2921796